Experimental evidence of T/sub BD/ power-law for voltage dependence of oxide breakdown in ultrathin gate oxides

By Ernest Y. Wu, Alex Vayshenker, Edward J. Nowak, Jordi Suñé, Rolf-Peter Vollertsen, Wing L. Lai, D. Harmon. 2002

133 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/81c959e039d11a7da54f02a299a11957f01aed22