E. Grimley
Electrical and Electronic Engineering · 2015–2017
A researcher in the Science corpus: 6 papers; trusts 4 researchers and is trusted by 4 researchers here, as inferred from the citation graph.
Subfields
- Electrical and Electronic Engineering — 110 citations into it; #7,924 of 16,539 by trust here, #4,249 by citations
- Materials Chemistry — 109 citations into it; #8,589 of 11,513 by trust here, #6,608 by citations
Whom E. Grimley trusts overall
Their strongest outbound trust, strongest first, inferred from their citations.
Who trusts E. Grimley overall
Papers from E. Grimley's perspective
Ordered by how strongly the researchers E. Grimley trusts endorse each paper. Same corpus, a different order for every researcher.
- Ferroelectric solid solutions with morphotropic boundaries: Vanishing polarization anisotropy, adaptive, polar glass, and two-phase states
- Influence of short-range and long-range order on the evolution of the morphotropic phase boundary in Pb Zr[sub 1−x]Ti[sub x] O₃
- Si Doped Hafnium Oxide—A “Fragile” Ferroelectric System
- Factors Favoring Ferroelectricity in Hafnia: A First-Principles Computational Study
- High dielectric constant gate oxides for metal oxide Si transistors
- Vacancy and interstitial defects in hafnia
- Novel ferroelectric FET based synapse for neuromorphic systems (Symposium on VLSI Technology)
- Ferroelectricity in hafnium oxide thin films
- A review of recent MOSFET threshold voltage extraction methods (Microelectronics and reliability)
- Ferroelectric hafnium oxide: A CMOS-compatible and highly scalable approach to future ferroelectric memories (2013 IEEE International Electron Devices Meeting)
Their papers
- Physical Mechanisms behind the Field‐Cycling Behavior of HfO2‐Based Ferroelectric Capacitors (2016) — 812 citations
- On the structural origins of ferroelectricity in HfO2 thin films (2015) — 575 citations
- Structural Changes Underlying Field‐Cycling Phenomena in Ferroelectric HfO2 Thin Films (2016) — 387 citations
- Si Doped Hafnium Oxide—A “Fragile” Ferroelectric System (2017) — 161 citations
- A comprehensive study on the structural evolution of HfO2 thin films doped with various dopants (2017) — 221 citations
- Atomic Structure of Domain and Interphase Boundaries in Ferroelectric HfO2 (2017) — 156 citations