James A. Cooper
Electrical and Electronic Engineering · 2000–2018
A researcher in the Science corpus: 8 papers; trusts 1 researcher and is trusted by 1 researcher here, as inferred from the citation graph.
Subfields
- Electrical and Electronic Engineering — 57 citations into it; #12,501 of 16,539 by trust here, #5,574 by citations
- Atomic and Molecular Physics, and Optics — 28 citations into it
Whom James A. Cooper trusts overall
Their strongest outbound trust, strongest first, inferred from their citations.
Who trusts James A. Cooper overall
Papers from James A. Cooper's perspective
Ordered by how strongly the researchers James A. Cooper trusts endorse each paper. Same corpus, a different order for every researcher.
- Fundamentals of Power Semiconductor Devices
- 1800 V NPN bipolar junction transistors in 4H-SiC (IEEE Electron Device Letters)
- Semiconductor Power Devices: Physics, Characteristics, Reliability
- III-Nitride Ultraviolet Emitters: Technology and Applications
- Properties of advanced semiconductor materials : GaN, AlN, InN, BN, SiC, SiGe
- Fundamentals of Silicon Carbide Technology: Growth, Characterization, Devices and Applications
- Recombination-enhanced extension of stacking faults in 4H-SiC p-i-n diodes under forward bias
- Crystal Defects as Source of Anomalous Forward Voltage Increase of 4H-SiC Diodes
- Degradation of hexagonal silicon-carbide-based bipolar devices
- Structure of recombination-induced stacking faults in high-voltage SiC p–n junctions
Their papers
- Top-gated graphene field-effect-transistors formed by decomposition of SiC (2008) — 219 citations
- Fundamentals of Silicon Carbide Technology: Growth, Characterization, Devices and Applications (2014) — 1,140 citations
- Status and prospects for SiC power MOSFETs (2002) — 489 citations
- Ultrawide‐Bandgap Semiconductors: Research Opportunities and Challenges (2018) — 1,374 citations
- Effect of process variations and ambient temperature on electron mobility at the SiO/sub 2//4H-SiC interface (2003) — 140 citations
- SiC power-switching devices-the second electronics revolution? (2002) — 363 citations
- SiC power Schottky and PiN diodes (2002) — 237 citations
- Measurement of high-field electron transport in silicon carbide (2000) — 144 citations