Lifetime-limiting defects in n− 4H-SiC epilayers

By P. Klein, B. V. Shanabrook, S. Huh, A. Polyakov, M. Skowronski, J. Sumakeris, M. O'loughlin. 2006

198 citations recorded by the source corpus.

Subfields: Atomic and Molecular Physics, and Optics, Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/51b4eaa79bceac62849abf2d19ca356e3af65e85