Computational method to estimate Single Event Upset rates in an accelerator environment

By M. Huhtinen, F. Faccio. 2000

154 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering, Nuclear and High Energy Physics, Pulmonary and Respiratory Medicine

View Paper: https://www.semanticscholar.org/paper/014c7570c6c30d605c2b71aba32eed5f98ab66a1

How researchers see this paper

The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.

In Electrical and Electronic Engineering

1. R. Lacoe
2. Lloyd W. Massengill
3. D. Fleetwood

In Nuclear and High Energy Physics

1. R. Lacoe

In Pulmonary and Respiratory Medicine

1. R. Lacoe

Citations in the corpus

• The contribution of nuclear reactions to heavy ion single event upset cross-section measurements in a high-density SEU hardened SRAM (2005, background): “Although the probability for nuclear reactions is small relative to direct ionization from the primary ion at typical accelerator energies, the reaction products may have stopping powers exceeding that of the primary ion [2].”
• Improving Integrated Circuit Performance Through the Application of Hardness-by-Design Methodology (2008, background): “The dashed line represents a typical cross-section curve for an unhardened memory. the primary particle [ 60 ]–[62].”