Wenping Wang

Electrical and Electronic Engineering · 2006 43rd ACM/IEEE Design Automation Conference · 2006–2010

A researcher in the Science corpus: 4 papers; trusts 4 researchers and is trusted by 0 researchers here, as inferred from the citation graph.

Subfields

• Electrical and Electronic Engineering — 30 citations into it

Whom Wenping Wang trusts overall

Their strongest outbound trust, strongest first, inferred from their citations.

1. Souvik Mahapatra
2. M. A. Alam
3. Wei Zhao
4. Yu Cao
5. Rakesh Vattikonda
6. Dieter K. Schroder
7. Sarvesh Bhardwaj

Papers from Wenping Wang's perspective

Ordered by how strongly the researchers Wenping Wang trusts endorse each paper. Same corpus, a different order for every researcher.

1. A comprehensive model of PMOS NBTI degradation (Microelectronics and reliability)
2. Negative bias temperature instability: Road to cross in deep submicron silicon semiconductor manufacturing
3. Investigation and modeling of interface and bulk trap generation during negative bias temperature instability of p-MOSFETs (IEEE Transactions on Electron Devices)
4. A comprehensive framework for predictive modeling of negative bias temperature instability (2004 IEEE International Reliability Physics Symposium. Proceedings)
5. Material dependence of hydrogen diffusion: implications for NBTI degradation (IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest.)
6. On the generation and recovery of interface traps in MOSFETs subjected to NBTI, FN, and HCI stress (IEEE Transactions on Electron Devices)
7. Dynamic NBTI of PMOS transistors and its impact on device lifetime (2003 IEEE International Reliability Physics Symposium Proceedings, 2003. 41st Annual.)
8. Impact of NBTI on the temporal performance degradation of digital circuits (IEEE Electron Device Letters)
9. A critical examination of the mechanics of dynamic NBTI for PMOSFETs (IEEE International Electron Devices Meeting 2003)
10. Modeling and minimization of PMOS NBTI effect for robust nanometer design (2006 43rd ACM/IEEE Design Automation Conference)

Their papers

• Modeling and minimization of PMOS NBTI effect for robust nanometer design (2006) — 504 citations
• Predictive Modeling of the NBTI Effect for Reliable Design (2006) — 455 citations
• Compact Modeling and Simulation of Circuit Reliability for 65-nm CMOS Technology (2007) — 374 citations
• The Impact of NBTI Effect on Combinational Circuit: Modeling, Simulation, and Analysis (2010) — 302 citations