Compact Modeling and Simulation of Circuit Reliability for 65-nm CMOS Technology

By Wenping Wang, V. Reddy, A. Krishnan, Rakesh Vattikonda, S. Krishnan, Yu Cao. IEEE transactions on device and materials reliability, 2007

374 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/6d9132f101a01886abf992974d950aaa446511a8

How researchers see this paper

The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.

In Electrical and Electronic Engineering

1. Wenping Wang
2. Sarma B. K. Vrudhula
3. Sarvesh Bhardwaj
4. Frank Liu
5. Shengqi Yang
6. Yu Cao
7. Carole-Jean Wu
8. Young Geun Kim

Citations in the corpus

• The Impact of NBTI Effect on Combinational Circuit: Modeling, Simulation, and Analysis (2010, background): “set of formula for the calculation of , [22] provides more details about the model derivation.”