Predictive Modeling of the NBTI Effect for Reliable Design

By Sarvesh Bhardwaj, Wenping Wang, Rakesh Vattikonda, Yu Cao, Sarma B. K. Vrudhula. IEEE Custom Integrated Circuits Conference, 2006

455 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/de261289a9968a90664f84f7696c3fd7a0f8d69c

How researchers see this paper

The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.

In Electrical and Electronic Engineering

1. Wenping Wang
2. Sarma B. K. Vrudhula
3. Sarvesh Bhardwaj
4. Frank Liu
5. Shengqi Yang
6. Yu Cao
7. Rakesh Vattikonda
8. Carole-Jean Wu

Citations in the corpus

• The Impact of NBTI Effect on Combinational Circuit: Modeling, Simulation, and Analysis (2010, background): “NBTI has strong dependence on and [14], [15].”
• Compact Modeling and Simulation of Circuit Reliability for 65-nm CMOS Technology (2007, background): “It is also proportional to the density of reaction species, namely holes or hot electrons [4], [7], [29].”