Sarvesh Bhardwaj

Electrical and Electronic Engineering · 2006–2010

A researcher in the Science corpus: 2 papers; trusts 1 researcher and is trusted by 0 researchers here, as inferred from the citation graph.

Subfields

Whom Sarvesh Bhardwaj trusts overall

Their strongest outbound trust, strongest first, inferred from their citations.

  1. M. A. Alam

Who trusts Sarvesh Bhardwaj overall

  1. Wenping Wang

Papers from Sarvesh Bhardwaj's perspective

Ordered by how strongly the researchers Sarvesh Bhardwaj trusts endorse each paper. Same corpus, a different order for every researcher.

  1. A comprehensive model of PMOS NBTI degradation (Microelectronics and reliability)
  2. Negative bias temperature instability: Road to cross in deep submicron silicon semiconductor manufacturing
  3. Investigation and modeling of interface and bulk trap generation during negative bias temperature instability of p-MOSFETs (IEEE Transactions on Electron Devices)
  4. Material dependence of hydrogen diffusion: implications for NBTI degradation (IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest.)
  5. On the generation and recovery of interface traps in MOSFETs subjected to NBTI, FN, and HCI stress (IEEE Transactions on Electron Devices)
  6. Dynamic NBTI of PMOS transistors and its impact on device lifetime (2003 IEEE International Reliability Physics Symposium Proceedings, 2003. 41st Annual.)
  7. Impact of NBTI on the temporal performance degradation of digital circuits (IEEE Electron Device Letters)
  8. Modeling and minimization of PMOS NBTI effect for robust nanometer design (2006 43rd ACM/IEEE Design Automation Conference)
  9. Predictive Modeling of the NBTI Effect for Reliable Design (IEEE Custom Integrated Circuits Conference)
  10. New Generation of Predictive Technology Model for Sub-45 nm Early Design Exploration (IEEE Transactions on Electron Devices)

Their papers