Andrew R. Brown
Electrical and Electronic Engineering · 2001–2011
A researcher in the Science corpus: 7 papers; trusts 4 researchers and is trusted by 7 researchers here, as inferred from the citation graph.
Subfields
- Electrical and Electronic Engineering — 15 citations into it; #3,982 of 16,539 by trust here, #6,558 by citations
Whom Andrew R. Brown trusts overall
Their strongest outbound trust, strongest first, inferred from their citations.
Who trusts Andrew R. Brown overall
Papers from Andrew R. Brown's perspective
Ordered by how strongly the researchers Andrew R. Brown trusts endorse each paper. Same corpus, a different order for every researcher.
- Intrinsic parameter fluctuations in decananometer MOSFETs introduced by gate line edge roughness
- Increase in the random dopant induced threshold fluctuations and lowering in sub-100 nm MOSFETs due to quantum effects: a 3-D density-gradient simulation study
- AND T
- RTS amplitudes in decananometer MOSFETs: 3-D simulation study
- Γ and B
- Temperature-Dependent Thermal Conductivity of Undoped Polycrystalline Silicon Layers
- Intrinsic threshold voltage fluctuations in decanano MOSFETs due to local oxide thickness variations
- High-performance CMOS variability in the 65-nm regime and beyond (IBM Journal of Research and Development)
- Process Technology Variation (IEEE Transactions on Electron Devices)
- Fringing fields in sub-0.1 μm fully depleted SOI MOSFETs: optimization of the device architecture
Their papers
- RTS amplitudes in decananometer MOSFETs: 3-D simulation study (2003) — 254 citations
- Increase in the random dopant induced threshold fluctuations and lowering in sub-100 nm MOSFETs due to quantum effects: a 3-D density-gradient simulation study (2001) — 237 citations
- Intrinsic parameter fluctuations in decananometer MOSFETs introduced by gate line edge roughness (2003) — 624 citations
- Simulation of intrinsic parameter fluctuations in decananometer and nanometer-scale MOSFETs (2003) — 599 citations
- Simulation Study of Individual and Combined Sources of Intrinsic Parameter Fluctuations in Conventional Nano-MOSFETs (2006) — 297 citations
- Poly-Si-Gate-Related Variability in Decananometer MOSFETs With Conventional Architecture (2007) — 143 citations
- Statistical variability and reliability in nanoscale FinFETs (2011) — 280 citations