Statistical variability and reliability in nanoscale FinFETs

By Xingsheng Wang, Andrew R. Brown, B. Cheng, Asen Asenov. International Electron Devices Meeting, 2011

280 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/58352ae40c0b13e6156a7178a79fbdcdd95fe9e7

How researchers see this paper

The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.

1. A. García-Loureiro
2. D. Nagy
3. N. Seoane
4. K. Kalna
5. G. Indalecio
6. M. Elmessary

Citations in the corpus

• FinFET Versus Gate-All-Around Nanowire FET: Performance, Scaling, and Variability (2018, background): “Overall, the linear behaviour that is observed for the σVT as a function GS is also demonstrated in [9].”