K. Hilton
Electrical and Electronic Engineering · IEEE Transactions on Electron Devices · 2003–2008
A researcher in the Science corpus: 4 papers; trusts 1 researcher and is trusted by 1 researcher here, as inferred from the citation graph.
Subfields
- Electrical and Electronic Engineering — 8 citations into it
- Materials Chemistry — 5 citations into it
Whom K. Hilton trusts
Their strongest outbound trust, strongest first, inferred from their citations.
- David L. Blackburn (in Electrical and Electronic Engineering)
Who trusts K. Hilton
- Martin Kuball (in Condensed Matter Physics)
Papers from K. Hilton's perspective
Ordered by how strongly the researchers K. Hilton trusts endorse each paper. Same corpus, a different order for every researcher.
- Measurement of temperature in active high-power AlGaN/GaN HFETs using Raman spectroscopy (IEEE Electron Device Letters)
- 30-W/mm GaN HEMTs by field plate optimization (IEEE Electron Device Letters)
- Modeling and Measuring the Effect of Refraction on the Depth Resolution of Confocal Raman Microscopy
- Temperature measurements of semiconductor devices - a review (Twentieth Annual IEEE Semiconductor Thermal Measurement and Management Symposium (IEEE Cat. No.04CH37545))
- Integrated micro-Raman/infrared thermography probe for monitoring of self-heating in AlGaN/GaN transistor structures (IEEE Transactions on Electron Devices)
- Thermal conductivity of GaN films: Effects of impurities and dislocations
- Raman spectroscopy of GaN, AlGaN and AlN for process and growth monitoring/control
- Trapping effects in GaN and SiC microwave FETs (Proceedings of the IEEE)
- Extremely Low On-Resistance and High Breakdown Voltage Observed in Vertical GaN Schottky Barrier Diodes with High-Mobility Drift Layers on Low-Dislocation-Density GaN Substrates
- Vertical GaN-based trench metal oxide semiconductor field-effect transistors on a free-standing GaN substrate with blocking voltage of 1.6 kV
Their papers
- Measurement of temperature distribution in multifinger AlGaN/GaN heterostructure field-effect transistors using micro-Raman spectroscopy (2003) — 189 citations
- Integrated micro-Raman/infrared thermography probe for monitoring of self-heating in AlGaN/GaN transistor structures (2006) — 249 citations
- Thermal Boundary Resistance Between GaN and Substrate in AlGaN/GaN Electronic Devices (2007) — 277 citations
- High-performance 40nm gate length InSb p-channel compressively strained quantum well field effect transistors for low-power (VCC=0.5V) logic applications (2008) — 181 citations