Modeling and Measuring the Effect of Refraction on the Depth Resolution of Confocal Raman Microscopy

By N. Everall. 2000

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The potential of Raman microscopy and Raman imaging in plant research (2007, background): “In addition to lateral x–y mappings also depth scans (x–z) are possible in the confocal mode, but for depth profiling the use of immersion objectives is recommended to minimise errors due to refraction at the sample surface [66,67].”
Integrated micro-Raman/infrared thermography probe for monitoring of self-heating in AlGaN/GaN transistor structures (2006, background): “Very often, exact values of conductivities and interface thermal resistances of the device materials required for realistic output of such simulations are not precisely known and have to be estimated [5], [37]–[39].”