Review and Reexamination of Reliability Effects Related to NBTI-Induced Statistical Variations

By Stewart E. Rauch. IEEE transactions on device and materials reliability, 2007

135 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/c5761b41318a356c864fc617132518e125857a6c

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In Electrical and Electronic Engineering

1. Tibor Grasser
2. Hans Reisinger
3. Ben Kaczer
4. Souvik Mahapatra
5. Dieter K. Schroder
6. Thomas Aichinger

Citations in the corpus

• Origin of NBTI variability in deeply scaled pFETs (2010, background): “[ 2 ,3,16]. For comparison, measured total ΔVth distributions from Ref.”