Borna Obradovic

Electrical and Electronic Engineering · 2004–2006

A researcher in the Science corpus: 4 papers; trusts 1 researcher and is trusted by 0 researchers here, as inferred from the citation graph.

Subfields

Whom Borna Obradovic trusts overall

Their strongest outbound trust, strongest first, inferred from their citations.

  1. Massimo V. Fischetti

Who trusts Borna Obradovic overall

  1. Frank Schwierz

Papers from Borna Obradovic's perspective

Ordered by how strongly the researchers Borna Obradovic trusts endorse each paper. Same corpus, a different order for every researcher.

  1. Fabrication and mobility characteristics of ultra-thin strained Si directly on insulator (SSDOI) MOSFETs (IEEE International Electron Devices Meeting 2003)
  2. A 90nm high volume manufacturing logic technology featuring novel 45nm gate length strained silicon CMOS transistors (IEEE International Electron Devices Meeting 2003)
  3. Mechanical stress effect of etch-stop nitride and its impact on deep submicron transistor design (International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No.00CH37138))
  4. Strained Si, SiGe, and Ge channels for high-mobility metal-oxide-semiconductor field-effect transistors
  5. Long-range Coulomb interactions in small Si devices. Part II. Effective electron mobility in thin-oxide structures
  6. Hole mobility enhancements and alloy scattering-limited mobility in tensile strained Si/SiGe surface channel metal-oxide-semiconductor field-effect transistors
  7. Six-band k⋅p calculation of the hole mobility in silicon inversion layers: Dependence on surface orientation, strain, and silicon thickness
  8. Device scaling limits of Si MOSFETs and their application dependencies (Proceedings of the IEEE)
  9. Limits to binary logic switch scaling - a gedanken model (Proceedings of the IEEE)
  10. Experimental study on carrier transport mechanism in ultrathin-body SOI nand p-MOSFETs with SOI thickness less than 5 nm (Digest. International Electron Devices Meeting,)

Their papers