Fabrizio Roccaforte
2002–2018
A researcher in the Science corpus: 7 papers; trusts 0 researchers and is trusted by 0 researchers here, as inferred from the citation graph.
Papers from Fabrizio Roccaforte's perspective
Ordered by how strongly the researchers Fabrizio Roccaforte trusts endorse each paper. Same corpus, a different order for every researcher.
- The effect of surface passivation on the microwave characteristics of undoped AlGaN/GaN HEMTs (IEEE Electron Device Letters)
- 10-W/mm AlGaN-GaN HFET with a field modulating plate (IEEE Electron Device Letters)
- The impact of surface states on the DC and RF characteristics of AlGaN/GaN HFETs
- 30-W/mm GaN HEMTs by field plate optimization (IEEE Electron Device Letters)
- High breakdown voltage AlGaN-GaN power-HEMT design and high current density switching behavior
- Forward Bias Gate Breakdown Mechanism in Enhancement-Mode p-GaN Gate AlGaN/GaN High-Electron Mobility Transistors (IEEE Electron Device Letters)
- Gate Injection Transistor (GIT)—A Normally-Off AlGaN/GaN Power Transistor Using Conductivity Modulation (IEEE Transactions on Electron Devices)
- Fundamentals of Power Semiconductor Devices
- 99.3% Efficiency of three-phase inverter for motor drive using GaN-based Gate Injection Transistors (Applied Power Electronics Conference)
- High breakdown GaN HEMT with overlapping gate structure (IEEE Electron Device Letters)
Their papers
- Recent advances on dielectrics technology for SiC and GaN power devices (2014) — 159 citations
- Emerging trends in wide band gap semiconductors (SiC and GaN) technology for power devices (2018) — 499 citations
- Review of technology for normally-off HEMTs with p-GaN gate (2017) — 263 citations
- Ohmic contacts to Gallium Nitride materials (2016) — 296 citations
- Barrier inhomogeneity and electrical properties of Pt∕GaN Schottky contacts (2007) — 168 citations
- Richardson’s constant in inhomogeneous silicon carbide Schottky contacts (2003) — 245 citations
- Structural and electrical characterisation of Titanium and Nickel silicide contacts on Silicon carbide (2002) — 136 citations