Ohmic contacts to Gallium Nitride materials
By Giuseppe Greco, F. Iucolano, Fabrizio Roccaforte. 2016
296 citations recorded by the source corpus.
Subfields: Condensed Matter Physics, Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials
View Paper: https://www.semanticscholar.org/paper/bfa73768609629a6e8fc8353ccddd8b7899871f1
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- Guangnan Zhou
- Hongyu Yu
- Fanming Zeng
- Wenmao Li
- Hui Wang
- T. Duan
- J. An
- Lingli Jiang
Citations in the corpus
- A Comprehensive Review of Recent Progress on GaN High Electron Mobility Transistors: Devices, Fabrication and Reliability (2018, background): “The most used stacks include Ti/x/x/Au structures [72], where x represents met l such as Al, Ni, Ti, Mo an so forth.”