Jeffrey D. Black
Electrical and Electronic Engineering · 2013
A researcher in the Science corpus: 1 paper; trusts 1 researcher and is trusted by 0 researchers here, as inferred from the citation graph.
Subfields
- Electrical and Electronic Engineering — 6 citations into it
Whom Jeffrey D. Black trusts overall
Their strongest outbound trust, strongest first, inferred from their citations.
Papers from Jeffrey D. Black's perspective
Ordered by how strongly the researchers Jeffrey D. Black trusts endorse each paper. Same corpus, a different order for every researcher.
- Basic mechanisms and modeling of single-event upset in digital microelectronics
- Charge Collection and Charge Sharing in a 130 nm CMOS Technology (IEEE Transactions on Nuclear Science)
- Soft error rate mitigation techniques for modern microcircuits (2002 IEEE International Reliability Physics Symposium. Proceedings. 40th Annual (Cat. No.02CH37320))
- Simultaneous single event charge sharing and parasitic bipolar conduction in a highly-scaled SRAM design (IEEE Transactions on Nuclear Science)
- Multiple Cell Upsets as the Key Contribution to the Total SER of 65 nm CMOS SRAMs and Its Dependence on Well Engineering (IEEE Transactions on Nuclear Science)
- Single-Event Transient Pulse Quenching in Advanced CMOS Logic Circuits (IEEE Transactions on Nuclear Science)
- Statistical Analysis of the Charge Collected in SOI and Bulk Devices Under Heavy lon and Proton Irradiation—Implications for Digital SETs (IEEE Transactions on Nuclear Science)
- Digital Single Event Transient Trends With Technology Node Scaling (IEEE Transactions on Nuclear Science)
- Subbandgap laser-induced single event effects: carrier generation via two-photon absorption
- RHBD techniques for mitigating effects of single-event hits using guard-gates (IEEE Transactions on Nuclear Science)