Multiple Cell Upsets as the Key Contribution to the Total SER of 65 nm CMOS SRAMs and Its Dependence on Well Engineering

By G. Gasiot, D. Giot, P. Roche. IEEE Transactions on Nuclear Science, 2007

148 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering, Hardware and Architecture

View Paper: https://www.semanticscholar.org/paper/56aea45245f7dda35bde56276d5e08d912fd29dd

How researchers see this paper

The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.

In Electrical and Electronic Engineering

1. Paul E. Dodd
2. K. Warren
3. Jeffrey D. Black

In Hardware and Architecture

1. Paul E. Dodd

Citations in the corpus

• Physics of Multiple-Node Charge Collection and Impacts on Single-Event Characterization and Soft Error Rate Prediction (2013, background): “went on to model the impact of the location of the well contacts and found that closer proximity to the well contact reduced MCU likelihood [33].”