Physics of Multiple-Node Charge Collection and Impacts on Single-Event Characterization and Soft Error Rate Prediction

By Jeffrey D. Black, Paul E. Dodd, K. Warren. IEEE Transactions on Nuclear Science, 2013

163 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/7ec1c8c4e21e4e97f26deb55834a2e8e96561ea9