Single-Event Transient Pulse Quenching in Advanced CMOS Logic Circuits

By J. Ahlbin, Lloyd W. Massengill, B. Bhuva, B. Narasimham, M. Gadlage, P. Eaton. IEEE Transactions on Nuclear Science, 2009

155 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering, Hardware and Architecture

View Paper: https://www.semanticscholar.org/paper/95b6c74579f51b840a6ee125904a7d21ddffc05b

How researchers see this paper

The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.

In Electrical and Electronic Engineering

1. Paul E. Dodd
2. K. Warren
3. Jeffrey D. Black

In Hardware and Architecture

1. Paul E. Dodd

Citations in the corpus

• Physics of Multiple-Node Charge Collection and Impacts on Single-Event Characterization and Soft Error Rate Prediction (2013, background): “Multiple-node charge collection’s effect on SET generation in an INV delay chain (after [8]).”