Circuit Failure Prediction and Its Application to Transistor Aging
By Mridul Agarwal, Bipul Chandra Paul, Ming Zhang, Subhasish G. Mitra. IEEE VLSI Test Symposium, 2007
480 citations recorded by the source corpus.
Subfields: Electrical and Electronic Engineering
View Paper: https://www.semanticscholar.org/paper/2cd5e4548d2b4f8a5ec37ca9c134684c65322dc6
How researchers see this paper
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- Bharath Muthiah
- Chris Mason
- S. Pendharkar
- Tejasvi Chakravarthy
- S. Sankar
- Matt Beadon
- H. Dixit
Citations in the corpus
- Silent Data Corruptions at Scale (2021, background): “When the device has been in the field serving workloads for a while, beyond their rated life, the entire silicon starts exhibiting wear-out [26], [20], [8].”