D. Saha

Electrical and Electronic Engineering · with Mahapatra · 2006–2007

A researcher in the Science corpus: 2 papers; trusts 2 researchers and is trusted by 0 researchers here, as inferred from the citation graph.

Subfields

Whom D. Saha trusts

Their strongest outbound trust, strongest first, inferred from their citations.

  1. M. A. Alam (in Electrical and Electronic Engineering)
  2. Souvik Mahapatra (in Electrical and Electronic Engineering)

Papers from D. Saha's perspective

Ordered by how strongly the researchers D. Saha trusts endorse each paper. Same corpus, a different order for every researcher.

  1. A comprehensive model of PMOS NBTI degradation (Microelectronics and reliability)
  2. A comprehensive framework for predictive modeling of negative bias temperature instability (2004 IEEE International Reliability Physics Symposium. Proceedings)
  3. Disorder-controlled-kinetics model for negative bias temperature instability and its experimental verification (2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual.)
  4. Material dependence of hydrogen diffusion: implications for NBTI degradation (IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest.)
  5. Universal recovery behavior of negative bias temperature instability [PMOSFETs] (IEEE International Electron Devices Meeting 2003)
  6. Dynamic recovery of negative bias temperature instability in p-type metal–oxide–semiconductor field-effect transistors
  7. Analysis of NBTI Degradation- and Recovery-Behavior Based on Ultra Fast VT-Measurements (2006 IEEE International Reliability Physics Symposium Proceedings)
  8. Investigation and modeling of interface and bulk trap generation during negative bias temperature instability of p-MOSFETs (IEEE Transactions on Electron Devices)
  9. Impact of NBTI on the temporal performance degradation of digital circuits (IEEE Electron Device Letters)
  10. Influence of cultivation temperature on the ligninolytic activity of selected fungal strains

Their papers