Ernest Y. Wu

Electrical and Electronic Engineering · 2000–2018

A researcher in the Science corpus: 5 papers; trusts 1 researcher and is trusted by 1 researcher here, as inferred from the citation graph.

Subfields

Whom Ernest Y. Wu trusts overall

Their strongest outbound trust, strongest first, inferred from their citations.

  1. Jordi Suñé

Who trusts Ernest Y. Wu overall

  1. Jordi Suñé

Papers from Ernest Y. Wu's perspective

Ordered by how strongly the researchers Ernest Y. Wu trusts endorse each paper. Same corpus, a different order for every researcher.

  1. New physics-based analytic approach to the thin-oxide breakdown statistics (IEEE Electron Device Letters)
  2. Multiple-gate SOI MOSFETs
  3. A continuous, analytic drain-current model for DG MOSFETs
  4. Beyond the conventional transistor (IBM Journal of Research and Development)
  5. Modeling of nanoscale gate-all-around MOSFETs (IEEE Electron Device Letters)
  6. Multiple-gate SOI MOSFETs: device design guidelines
  7. Ultra-thin oxide reliability for ULSI applications
  8. Electronics using hybrid-molecular and mono-molecular devices (Nature)
  9. Rapid nanopore discrimination between single polynucleotide molecules. (Proceedings of the National Academy of Sciences of the United States of America)
  10. Disorder-controlled-kinetics model for negative bias temperature instability and its experimental verification (2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual.)

Their papers