Reliability Wearout Mechanisms in Advanced CMOS Technologies

By A. Strong, Ernest Y. Wu, Rolf-Peter Vollertsen, Jordi Suñé, G. L. Rosa, T. Sullivan. 2009

150 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/a162ace5211c91f8b129d5138f6849ef3551c893