H. Ji
Electrical and Electronic Engineering · with Hilton · 2006–2007
A researcher in the Science corpus: 2 papers; trusts 1 researcher and is trusted by 0 researchers here, as inferred from the citation graph.
Subfields
- Electrical and Electronic Engineering — 7 citations into it
Whom H. Ji trusts overall
Their strongest outbound trust, strongest first, inferred from their citations.
Papers from H. Ji's perspective
Ordered by how strongly the researchers H. Ji trusts endorse each paper. Same corpus, a different order for every researcher.
- Measurement of temperature in active high-power AlGaN/GaN HFETs using Raman spectroscopy (IEEE Electron Device Letters)
- 30-W/mm GaN HEMTs by field plate optimization (IEEE Electron Device Letters)
- Modeling and Measuring the Effect of Refraction on the Depth Resolution of Confocal Raman Microscopy
- Temperature measurements of semiconductor devices - a review (Twentieth Annual IEEE Semiconductor Thermal Measurement and Management Symposium (IEEE Cat. No.04CH37545))
- Integrated micro-Raman/infrared thermography probe for monitoring of self-heating in AlGaN/GaN transistor structures (IEEE Transactions on Electron Devices)
- Thermal conductivity of GaN films: Effects of impurities and dislocations
- Raman spectroscopy of GaN, AlGaN and AlN for process and growth monitoring/control
- Trapping effects in GaN and SiC microwave FETs (Proceedings of the IEEE)
- Thermometry and Thermal Transport in Micro/Nanoscale Solid-State Devices and Structures
- SOI thermal impedance extraction methodology and its significance for circuit simulation