Norbert Seifert

2006 IEEE International Reliability Physics Symposium Proceedings · 2002–2006

A researcher in the Science corpus: 2 papers; trusts 0 researchers and is trusted by 2 researchers here, as inferred from the citation graph.

Who trusts Norbert Seifert overall

  1. Paul E. Dodd
  2. Lloyd W. Massengill
  3. Quming Zhou

Papers from Norbert Seifert's perspective

Ordered by how strongly the researchers Norbert Seifert trusts endorse each paper. Same corpus, a different order for every researcher.

  1. Impact of CMOS technology scaling on the atmospheric neutron soft error rate
  2. The impact of technology scaling on soft error rate performance and limits to the efficacy of error correction (Digest. International Electron Devices Meeting,)
  3. Impact of scaling on soft-error rates in commercial microprocessors
  4. Modeling the effect of technology trends on the soft error rate of combinational logic (Proceedings : International Conference on Dependable Systems and Networks)
  5. Neutron soft error rate measurements in a 90-nm CMOS process and scaling trends in SRAM from 0.25-/spl mu/m to 90-nm generation (IEEE International Electron Devices Meeting 2003)
  6. Characterization of soft errors caused by single event upsets in CMOS processes (IEEE Transactions on Dependable and Secure Computing)
  7. Scaling trends of cosmic ray induced soft errors in static latches beyond 0.18 /spl mu/ (2001 Symposium on VLSI Circuits. Digest of Technical Papers (IEEE Cat. No.01CH37185))
  8. Area-efficient linear regulator with ultra-fast load regulation (IEEE Journal of Solid-State Circuits)
  9. A capacitor-free CMOS low-dropout regulator with damping-factor-control frequency compensation (IEEE J. Solid State Circuits)
  10. Razor: a low-power pipeline based on circuit-level timing speculation

Their papers