Characterization of soft errors caused by single event upsets in CMOS processes

By T. Karnik, P. Hazucha, J. Patel. IEEE Transactions on Dependable and Secure Computing, 2004

567 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering, Hardware and Architecture

View Paper: https://www.semanticscholar.org/paper/9b248e8902d2ccf3b11a3696a2b18b6f11fbedef

How researchers see this paper

The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.

In Electrical and Electronic Engineering

1. Nicholas J. Wang
2. Sanjay J. Patel
3. Norbert Seifert

In Hardware and Architecture

1. Nicholas J. Wang
2. Sanjay J. Patel
3. Norbert Seifert

Citations in the corpus

• ReStore: symptom based soft error detection in microprocessors (2005, background): “However, combinational networks have much lower sensitivities due to pulse attenuation, logical masking, and latching-window masking; they are not as problematic as state elements [14].”
• Radiation-Induced Soft Error Rates of Advanced CMOS Bulk Devices (2006, methodology): “We typically use several flavors of latch TV with several different diffusion sizes in order to model the diffusion size effect [7].”