Quming Zhou
Electrical and Electronic Engineering · 2006
A researcher in the Science corpus: 1 paper; trusts 1 researcher and is trusted by 0 researchers here, as inferred from the citation graph.
Subfields
- Electrical and Electronic Engineering — 9 citations into it
- Hardware and Architecture — 7 citations into it
Whom Quming Zhou trusts overall
Their strongest outbound trust, strongest first, inferred from their citations.
Papers from Quming Zhou's perspective
Ordered by how strongly the researchers Quming Zhou trusts endorse each paper. Same corpus, a different order for every researcher.
- Impact of CMOS technology scaling on the atmospheric neutron soft error rate
- Impact of scaling on soft-error rates in commercial microprocessors
- Modeling the effect of technology trends on the soft error rate of combinational logic (Proceedings : International Conference on Dependable Systems and Networks)
- Basic mechanisms and modeling of single-event upset in digital microelectronics
- New paradigm of predictive MOSFET and interconnect modeling for early circuit simulation (Proceedings of the IEEE Custom Integrated Circuits Conference)
- Transient fault detection via simultaneous multithreading (Proceedings of 27th International Symposium on Computer Architecture (IEEE Cat. No.RS00201))
- Transient-fault recovery using simultaneous multithreading (Proceedings 29th Annual International Symposium on Computer Architecture)
- Cost-effective approach for reducing soft error failure rate in logic circuits (International Test Conference, 2003. Proceedings. ITC 2003.)
- Soft error rate mitigation techniques for modern microcircuits (2002 IEEE International Reliability Physics Symposium. Proceedings. 40th Annual (Cat. No.02CH37320))
- EIE: Efficient Inference Engine on Compressed Deep Neural Network
Their papers
- Gate sizing to radiation harden combinational logic (2006) — 345 citations