Cristian Constantinescu
IEEE Micro · 2003
A researcher in the Science corpus: 1 paper; trusts 1 researcher and is trusted by 0 researchers here, as inferred from the citation graph.
Whom Cristian Constantinescu trusts overall
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Who trusts Cristian Constantinescu overall
Papers from Cristian Constantinescu's perspective
Ordered by how strongly the researchers Cristian Constantinescu trusts endorse each paper. Same corpus, a different order for every researcher.
- Impact of CMOS technology scaling on the atmospheric neutron soft error rate
- The microarchitecture of the Pentium 4 processor
- The future of wires (Proceedings of the IEEE)
- Slipstream processors: improving both performance and fault tolerance (SIGP)
- Transient fault detection via simultaneous multithreading (Proceedings of 27th International Symposium on Computer Architecture (IEEE Cat. No.RS00201))
- Disorder-controlled-kinetics model for negative bias temperature instability and its experimental verification (2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual.)
- A comprehensive model of PMOS NBTI degradation (Microelectronics and reliability)
- A critical examination of the mechanics of dynamic NBTI for PMOSFETs (IEEE International Electron Devices Meeting 2003)
- Physical mechanisms of negative-bias temperature instability
- A comprehensive framework for predictive modeling of negative bias temperature instability (2004 IEEE International Reliability Physics Symposium. Proceedings)
Their papers
- Trends and Challenges in VLSI Circuit Reliability (2003) — 659 citations