Trends and Challenges in VLSI Circuit Reliability

By Cristian Constantinescu. IEEE Micro, 2003

659 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering, Hardware and Architecture

View Paper: https://www.semanticscholar.org/paper/5eb0d58f4d0f68b9b596474cdd5e2372a357a923

How researchers see this paper

The researchers whose trusted networks rank it highest, strongest advocate first. Every researcher gets a different order.

In Electrical and Electronic Engineering

1. John M. Shalf

In Hardware and Architecture

1. Herbert Bos
2. Bart Preneel
3. John M. Shalf

Citations in the corpus

• Memory Errors in Modern Systems: The Good, The Bad, and The Ugly (2015, background): “Hardware faults can further be classified as transient, intermittent, or hard [7] [10] [11].”
• Flip Feng Shui: Hammering a Needle in the Software Stack (2016, background): “For example, a large fraction of the DRAM chips produced in recent years are prone to bit flips [34, 51], and hardware errors in CPUs are expected to become mainstream in the near future [10, 16, 37, 53].”