Simone Lavizzari
Electrical and Electronic Engineering · 2007–2018
A researcher in the Science corpus: 3 papers; trusts 2 researchers and is trusted by 0 researchers here, as inferred from the citation graph.
Subfields
- Electrical and Electronic Engineering — 13 citations into it
- Materials Chemistry — 12 citations into it
Whom Simone Lavizzari trusts overall
Their strongest outbound trust, strongest first, inferred from their citations.
Papers from Simone Lavizzari's perspective
Ordered by how strongly the researchers Simone Lavizzari trusts endorse each paper. Same corpus, a different order for every researcher.
- Analytical model for subthreshold conduction and threshold switching in chalcogenide-based memory devices
- Investigation of the optical and electronic properties of Ge2Sb2Te5 phase change material in its amorphous, cubic, and hexagonal phases
- Electronic switching in phase-change memories (IEEE Transactions on Electron Devices)
- Current status of the phase change memory and its future (IEEE International Electron Devices Meeting 2003)
- Physical interpretation, modeling and impact on phase change memory (PCM) reliability of resistance drift due to chalcogenide structural relaxation (2007 IEEE International Electron Devices Meeting)
- Interfaces and defects of high-K oxides on silicon
- Recovery and Drift Dynamics of Resistance and Threshold Voltages in Phase-Change Memories (IEEE Transactions on Electron Devices)
- Threshold switching mechanism by high-field energy gain in the hopping transport of chalcogenide glasses
- A Low-Power Nonvolatile Switching Element Based on Copper-Tungsten Oxide Solid Electrolyte (IEEE transactions on nanotechnology)
- Low Power and High Speed Switching of Ti-doped NiO ReRAM under the Unipolar Voltage Source of less than 3 V (2007 IEEE International Electron Devices Meeting)
Their papers
- Physical interpretation, modeling and impact on phase change memory (PCM) reliability of resistance drift due to chalcogenide structural relaxation (2007) — 153 citations
- Reliability Impact of Chalcogenide-Structure Relaxation in Phase-Change Memory (PCM) Cells—Part I: Experimental Study (2009) — 154 citations
- Vertical Ferroelectric HfO2 FET based on 3-D NAND Architecture: Towards Dense Low-Power Memory (2018) — 133 citations