Hyunjin Lee
Electrical and Electronic Engineering · 2009
A researcher in the Science corpus: 1 paper; trusts 11 researchers and is trusted by 3 researchers here, as inferred from the citation graph.
Subfields
- Electrical and Electronic Engineering — 8 citations into it; #9,499 of 16,539 by trust here, #15,621 by citations
- Hardware and Architecture — 5 citations into it; #939 of 1,551 by trust here, #1,455 by citations
- Materials Chemistry — 5 citations into it; #6,348 of 11,513 by trust here, #11,278 by citations
Whom Hyunjin Lee trusts overall
Their strongest outbound trust, strongest first, inferred from their citations.
Who trusts Hyunjin Lee overall
Papers from Hyunjin Lee's perspective
Ordered by how strongly the researchers Hyunjin Lee trusts endorse each paper. Same corpus, a different order for every researcher.
- Current status of the phase change memory and its future (IEEE International Electron Devices Meeting 2003)
- A durable and energy efficient main memory using phase change memory technology (International Symposium on Computer Architecture)
- Scalable high performance main memory system using phase-change memory technology (International Symposium on Computer Architecture)
- Architecting phase change memory as a scalable dram alternative (International Symposium on Computer Architecture)
- Phase-change random access memory: A scalable technology (IBM Journal of Research and Development)
- Pin: building customized program analysis tools with dynamic instrumentation (ACM-SIGPLAN Symposium on Programming Language Design and Implementation)
- MiBench: A free, commercially representative embedded benchmark suite (Proceedings of the Fourth Annual IEEE International Workshop on Workload Characterization. WWC-4 (Cat. No.01EX538))
- Scaling analysis of phase-change memory technology (IEEE International Electron Devices Meeting 2003)
- Ultra-Thin Phase-Change Bridge Memory Device Using GeSb (International Electron Devices Meeting)
- OUM - A 180 nm nonvolatile memory cell element technology for stand alone and embedded applications (International Electron Devices Meeting. Technical Digest (Cat. No.01CH37224))