S. Munk‐Nielsen
Electrical and Electronic Engineering · 2002–2016
A researcher in the Science corpus: 4 papers; trusts 2 researchers and is trusted by 2 researchers here, as inferred from the citation graph.
Subfields
- Electrical and Electronic Engineering — 12 citations into it; #11,005 of 16,539 by trust here, #11,977 by citations
Whom S. Munk‐Nielsen trusts overall
Their strongest outbound trust, strongest first, inferred from their citations.
Who trusts S. Munk‐Nielsen overall
Papers from S. Munk‐Nielsen's perspective
Ordered by how strongly the researchers S. Munk‐Nielsen trusts endorse each paper. Same corpus, a different order for every researcher.
- Using the chip as a temperature sensor — The influence of steep lateral temperature gradients on the Vce(T)-measurement (EPE)
- Comparison of Junction Temperature Evaluations in a Power IGBT Module Using an IR Camera and Three Thermosensitive Electrical Parameters (IEEE transactions on industry applications)
- Toward Reliable Power Electronics: Challenges, Design Tools, and Opportunities (IEEE Industrial Electronics Magazine)
- Temperature Measurement of Power Semiconductor Devices by Thermo-Sensitive Electrical Parameters—A Review (IEEE transactions on power electronics)
- Selected failure mechanisms of modern power modules (Microelectronics and reliability)
- Temperature measurements of semiconductor devices - a review (Twentieth Annual IEEE Semiconductor Thermal Measurement and Management Symposium (IEEE Cat. No.04CH37545))
- Void induced thermal impedance in power semiconductor modules: some transient temperature effects (Conference Record of the 2001 IEEE Industry Applications Conference. 36th IAS Annual Meeting (Cat. No.01CH37248))
- Silicon Carbide Power Transistors: A New Era in Power Electronics Is Initiated (IEEE Industrial Electronics Magazine)
- Recent advances on dielectrics technology for SiC and GaN power devices
- Characterization and Experimental Assessment of the Effects of Parasitic Elements on the MOSFET Switching Performance (IEEE transactions on power electronics)
Their papers
- An overview of the reliability prediction related aspects of high power IGBTs in wind power applications (2011) — 298 citations
- IGBT Junction Temperature Measurement via Peak Gate Current (2016) — 147 citations
- Influences of Device and Circuit Mismatches on Paralleling Silicon Carbide MOSFETs (2016) — 267 citations
- Control in Power Electronics : selected problems (2002) — 262 citations