Influences of Device and Circuit Mismatches on Paralleling Silicon Carbide MOSFETs

By Helong Li, S. Munk‐Nielsen, Xiongfei Wang, R. Maheshwari, S. Bęczkowski, C. Uhrenfeldt, Wulf-Toke Franke. IEEE transactions on power electronics, 2016

267 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/d269a90f95df5c082645c35311c29c7f1fe90d3b