R. Bruchhaus

Electrical and Electronic Engineering · 2011

A researcher in the Science corpus: 1 paper; trusts 3 researchers and is trusted by 1 researcher here, as inferred from the citation graph.

Subfields

Whom R. Bruchhaus trusts overall

Their strongest outbound trust, strongest first, inferred from their citations.

  1. Daniele Ielmini
  2. U. Russo
  3. Rainer Waser

Who trusts R. Bruchhaus overall

  1. Daniele Ielmini

Papers from R. Bruchhaus's perspective

Ordered by how strongly the researchers R. Bruchhaus trusts endorse each paper. Same corpus, a different order for every researcher.

  1. Low Power and High Speed Switching of Ti-doped NiO ReRAM under the Unipolar Voltage Source of less than 3 V (2007 IEEE International Electron Devices Meeting)
  2. Self-Accelerated Thermal Dissolution Model for Reset Programming in Unipolar Resistive-Switching Memory (RRAM) Devices (IEEE Transactions on Electron Devices)
  3. Dielectric breakdown mechanisms in gate oxides
  4. Filament Conduction and Reset Mechanism in NiO-Based Resistive-Switching Memory (RRAM) Devices (IEEE Transactions on Electron Devices)
  5. Nanoionics-based resistive switching memories. (Nature Materials)
  6. Low power and high speed bipolar switching with a thin reactive Ti buffer layer in robust HfO2 based RRAM (2008 IEEE International Electron Devices Meeting)
  7. Two Series Oxide Resistors Applicable to High Speed and High Density Nonvolatile Memory
  8. Effects of heat dissipation on unipolar resistance switching in Pt∕NiO∕Pt capacitors
  9. Random Circuit Breaker Network Model for Unipolar Resistance Switching
  10. Observation of electric-field induced Ni filament channels in polycrystalline NiOx film

Their papers