O. Pirrotta

Electrical and Electronic Engineering · 2015

A researcher in the Science corpus: 1 paper; trusts 1 researcher and is trusted by 1 researcher here, as inferred from the citation graph.

Subfields

Whom O. Pirrotta trusts overall

Their strongest outbound trust, strongest first, inferred from their citations.

  1. Daniele Ielmini

Who trusts O. Pirrotta overall

  1. Daniele Ielmini

Papers from O. Pirrotta's perspective

Ordered by how strongly the researchers O. Pirrotta trusts endorse each paper. Same corpus, a different order for every researcher.

  1. Random Circuit Breaker Network Model for Unipolar Resistance Switching
  2. Thermal Properties of Ultrathin Hafnium Oxide Gate Dielectric Films (IEEE Electron Device Letters)
  3. Highly scalable hafnium oxide memory with improvements of resistive distribution and read disturb immunity (International Electron Devices Meeting)
  4. Thermochemical description of dielectric breakdown in high dielectric constant materials
  5. Modeling the Universal Set/Reset Characteristics of Bipolar RRAM by Field- and Temperature-Driven Filament Growth (IEEE Transactions on Electron Devices)
  6. Metal–Oxide RRAM (Proceedings of the IEEE)
  7. Grain boundary-driven leakage path formation in HfO2 dielectrics (2010 Proceedings of the European Solid State Device Research Conference)
  8. The interaction of oxygen vacancies with grain boundaries in monoclinic HfO2
  9. Resistive switching in hafnium dioxide layers: Local phenomenon at grain boundaries
  10. Low power and high speed bipolar switching with a thin reactive Ti buffer layer in robust HfO2 based RRAM (2008 IEEE International Electron Devices Meeting)

Their papers