Pascale Gouker

Electrical and Electronic Engineering · 2013

A researcher in the Science corpus: 1 paper; trusts 6 researchers and is trusted by 0 researchers here, as inferred from the citation graph.

Subfields

Whom Pascale Gouker trusts overall

Their strongest outbound trust, strongest first, inferred from their citations.

  1. Paul E. Dodd
  2. Kartik Mohanram

Papers from Pascale Gouker's perspective

Ordered by how strongly the researchers Pascale Gouker trusts endorse each paper. Same corpus, a different order for every researcher.

  1. Production and propagation of single-event transients in high-speed digital logic ICs (IEEE Transactions on Nuclear Science)
  2. Statistical Analysis of the Charge Collected in SOI and Bulk Devices Under Heavy lon and Proton Irradiation—Implications for Digital SETs (IEEE Transactions on Nuclear Science)
  3. Heavy ion-induced digital single-event transients in deep submicron Processes (IEEE Transactions on Nuclear Science)
  4. On-Chip Characterization of Single-Event Transient Pulsewidths (IEEE transactions on device and materials reliability)
  5. Soft error rate mitigation techniques for modern microcircuits (2002 IEEE International Reliability Physics Symposium. Proceedings. 40th Annual (Cat. No.02CH37320))
  6. Basic mechanisms and modeling of single-event upset in digital microelectronics
  7. The impact of technology scaling on soft error rate performance and limits to the efficacy of error correction (Digest. International Electron Devices Meeting,)
  8. Impact of scaling on soft-error rates in commercial microprocessors
  9. Digital Single Event Transient Trends With Technology Node Scaling (IEEE Transactions on Nuclear Science)
  10. New Insights Into Single Event Transient Propagation in Chains of Inverters—Evidence for Propagation-Induced Pulse Broadening (IEEE Transactions on Nuclear Science)

Their papers