Aaron Stillmaker
Electrical and Electronic Engineering · 2017
A researcher in the Science corpus: 1 paper; trusts 1 researcher and is trusted by 0 researchers here, as inferred from the citation graph.
Subfields
- Electrical and Electronic Engineering — 10 citations into it
Whom Aaron Stillmaker trusts overall
Their strongest outbound trust, strongest first, inferred from their citations.
Papers from Aaron Stillmaker's perspective
Ordered by how strongly the researchers Aaron Stillmaker trusts endorse each paper. Same corpus, a different order for every researcher.
- Cramming More Components Onto Integrated Circuits
- Sub-10 nm carbon nanotube transistor (International Electron Devices Meeting)
- In search of "Forever," continued transistor scaling one new material at a time (IEEE transactions on semiconductor manufacturing)
- Considerations for Ultimate CMOS Scaling (IEEE Transactions on Electron Devices)
- CMOS VLSI Design: A Circuits and Systems Perspective
- Exploring sub-20nm FinFET design with Predictive Technology Models (DAC Design Automation Conference 2012)
- A 22nm high performance and low-power CMOS technology featuring fully-depleted tri-gate transistors, self-aligned contacts and high density MIM capacitors (Symposium on VLSI Technology)
- Dark silicon and the end of multicore scaling
- Delaying forever: Uniaxial strained silicon transistors in a 90nm CMOS technology (Digest of Technical Papers. 2004 Symposium on VLSI Technology, 2004.)
- A 90-nm logic technology featuring strained-silicon (IEEE Transactions on Electron Devices)
Their papers
- Scaling equations for the accurate prediction of CMOS device performance from 180 nm to 7 nm (2017) — 469 citations