Scaling equations for the accurate prediction of CMOS device performance from 180 nm to 7 nm

By Aaron Stillmaker, Bevan M. Baas. Integr., 2017

469 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/fe74436c7c1b822707712991b376a7d6618909ae