Yu Cai
Computer Networks and Communications · 2012–2017
A researcher in the Science corpus: 4 papers; trusts 4 researchers and is trusted by 5 researchers here, as inferred from the citation graph.
Subfields
- Computer Networks and Communications — 39 citations into it; #4,007 of 9,886 by trust here, #4,128 by citations
- Electrical and Electronic Engineering — 31 citations into it; #10,303 of 16,539 by trust here, #13,165 by citations
- Hardware and Architecture — 25 citations into it; #1,022 of 1,551 by trust here, #1,153 by citations
- Artificial Intelligence — 8 citations into it
- Information Systems — 7 citations into it
Whom Yu Cai trusts overall
Their strongest outbound trust, strongest first, inferred from their citations.
- Onur Mutlu
- Gordon L. Stuber
- Joan Daemen
- Daniel Gruss
- Erich F. Haratsch
- Dushyanth Narayanan
- Jeong-Uk Kang
- Sivan Toledo
- Yoongu Kim
- Victor van der Veen
Who trusts Yu Cai overall
Papers from Yu Cai's perspective
Ordered by how strongly the researchers Yu Cai trusts endorse each paper. Same corpus, a different order for every researcher.
- Flash EEPROM threshold instabilities due to charge trapping during program/erase cycling (IEEE transactions on device and materials reliability)
- Low-Density Parity-Check Codes
- Parallelism-Aware Batch Scheduling: Enhancing both Performance and Fairness of Shared DRAM Systems (International Symposium on Computer Architecture)
- Design Tradeoffs for SSD Performance (USENIX Annual Technical Conference)
- Rowhammer.js: A Remote Software-Induced Fault Attack in JavaScript (International Conference on Detection of intrusions and malware, and vulnerability assessment)
- Introduction to flash memory (Proceedings of the IEEE)
- Algorithms and data structures for flash memories (CSUR)
- Drammer: Deterministic Rowhammer Attacks on Mobile Platforms (Conference on Computer and Communications Security)
- Phase change memory (Science China Information Sciences)
- Design of capacity-approaching irregular low-density parity-check codes (IEEE Transactions on Information Theory)
Their papers
- Threshold voltage distribution in MLC NAND flash memory: Characterization, analysis, and modeling (2013) — 304 citations
- Error patterns in MLC NAND flash memory: Measurement, characterization, and analysis (2012) — 423 citations
- Error Characterization, Mitigation, and Recovery in Flash-Memory-Based Solid-State Drives (2017) — 330 citations
- Data retention in MLC NAND flash memory: Characterization, optimization, and recovery (2015) — 299 citations