Tohru Tsuruoka
Electrical and Electronic Engineering · 2011–2015
A researcher in the Science corpus: 5 papers; trusts 2 researchers and is trusted by 2 researchers here, as inferred from the citation graph.
Subfields
- Electrical and Electronic Engineering — 53 citations into it; #10,376 of 16,539 by trust here, #3,278 by citations
Whom Tohru Tsuruoka trusts overall
Their strongest outbound trust, strongest first, inferred from their citations.
Who trusts Tohru Tsuruoka overall
Papers from Tohru Tsuruoka's perspective
Ordered by how strongly the researchers Tohru Tsuruoka trusts endorse each paper. Same corpus, a different order for every researcher.
- Nanoionics-based resistive switching memories. (Nature Materials)
- The formation of molecular clouds in spiral galaxies
- Memristive switching mechanism for metal/oxide/metal nanodevices. (Nature Nanotechnology)
- Conductive bridging RAM (CBRAM): an emerging non-volatile memory technology scalable to sub 20nm (IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest.)
- Understanding the switching-off mechanism in Ag+ migration based resistively switching model systems
- Nanometer-scale switches using copper sulfide
- Low current resistive switching in Cu–SiO2 cells
- Study of Multilevel Programming in Programmable Metallization Cell (PMC) Memory (IEEE Transactions on Electron Devices)
- Space charge conduction: Simple analytical solutions for ionic and mixed conductors and application to nanocrystalline ceria
- Nanoscale molecular-switch devices fabricated by imprint lithography
Their papers
- Short-term plasticity and long-term potentiation mimicked in single inorganic synapses. (2011) — 1,605 citations
- Controlling the Synaptic Plasticity of a Cu2S Gap‐Type Atomic Switch (2012) — 160 citations
- Effects of Moisture on the Switching Characteristics of Oxide‐Based, Gapless‐Type Atomic Switches (2012) — 258 citations
- Atomic Switch: Atom/Ion Movement Controlled Devices for Beyond Von‐Neumann Computers (2012) — 348 citations
- Redox Reactions at Cu,Ag/Ta2O5 Interfaces and the Effects of Ta2O5 Film Density on the Forming Process in Atomic Switch Structures (2015) — 156 citations