T. Kelly
Science · 2000–2013
A researcher in the Science corpus: 7 papers; trusts 1 researcher and is trusted by 10 researchers here, as inferred from the citation graph.
Whom T. Kelly trusts overall
Their strongest outbound trust, strongest first, inferred from their citations.
Who trusts T. Kelly overall
Papers from T. Kelly's perspective
Ordered by how strongly the researchers T. Kelly trusts endorse each paper. Same corpus, a different order for every researcher.
- Atom‐probe field‐ion microscopy
- Microscopy Society of America (Microscopy and Microanalysis)
- The first direct observation of hydrogen trapping sites in TiC precipitation-hardening steel through atom probe tomography
- Nanowire transistors without junctions. (Nature Nanotechnology)
- FinFET-a self-aligned double-gate MOSFET scalable to 20 nm
- Sensitivity of double-gate and FinFETDevices to process variations
- High immunity to threshold voltage variability in undoped ultra-thin FDSOI MOSFETs and its physical understanding (2008 IEEE International Electron Devices Meeting)
- Planar Bulk MOSFETs Versus FinFETs: An Analog/RF Perspective (IEEE Transactions on Electron Devices)
- Cramming More Components Onto Integrated Circuits
- Reduced electric field in junctionless transistors
Their papers
- Strength and breaking mechanism of multiwalled carbon nanotubes under tensile load (2000) — 5,201 citations
- In situ site-specific specimen preparation for atom probe tomography. (2007) — 1,627 citations
- Invited review article: Atom probe tomography. (2007) — 778 citations
- Local Electrode Atom Probe Tomography: A User's Guide (2013) — 442 citations
- Wide-Field-of-View Atom Probe Reconstruction (2009) — 152 citations
- Atomic scale structure of sputtered metal multilayers (2001) — 682 citations
- Atom Probe Tomography 2012 (2012) — 243 citations