In situ site-specific specimen preparation for atom probe tomography.

By K. Thompson, D. Lawrence, D. Larson, J. D. Olson, T. Kelly, B. Gorman. Ultramicroscopy, 2007

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Effect of ruthenium on the precipitation of topologically close packed phases in Ni-based superalloys of 3rd and 4th generation (2015, methodology): “focused-ion-beam (FIB) system (FEI Helios Nanolab 600) and the site-specific lift-out technique described in [24].”
Development of a Refractory High Entropy Superalloy (2016, methodology): “For preparing sharp nanotips suitable for APT, a standard lift-out, mounting and nanotip sharpening technique was utilized [27,28] employing a FEI Helios 600 Nanolab focused-ion beam (FIB) microscope.”
Passivation of a corrosion resistant high entropy alloy in non-oxidizing sulfate solutions (2019, positive): “Needle-shaped APT specimens (~100 nm diam) were prepared without disturbing the capped oxide using conventional focused ion beam (FIB)-based liftout and annular sharpening methods [59,60].”
Three-dimensional nanoscale characterisation of materials by atom probe tomography (2018, methodology): “for APT analysis is based on the site-specific lift-out method using a dual beam FIB–SEM equipped with a nanomanipulator system (referred to here as just FIB) [27].”