Hui Huang
IEEE transactions on power electronics · with Mawby · 2013
A researcher in the Science corpus: 1 paper; trusts 4 researchers and is trusted by 3 researchers here, as inferred from the citation graph.
Whom Hui Huang trusts overall
Their strongest outbound trust, strongest first, inferred from their citations.
Who trusts Hui Huang overall
Papers from Hui Huang's perspective
Ordered by how strongly the researchers Hui Huang trusts endorse each paper. Same corpus, a different order for every researcher.
- Selected failure mechanisms of modern power modules (Microelectronics and reliability)
- Two-step parameter extraction procedure with formal optimization for physics-based circuit simulator IGBT and p-i-n diode models (IEEE transactions on power electronics)
- Exploration of Power Device Reliability Using Compact Device Models and Fast Electrothermal Simulation (IEEE transactions on industry applications)
- An assessment of wide bandgap semiconductors for power devices
- A thermal model for insulated gate bipolar transistor module (IEEE transactions on power electronics)
- Predicting solder joint reliability for thermal, power, and bend cycle within 25% accuracy (2001 Proceedings. 51st Electronic Components and Technology Conference (Cat. No.01CH37220))
- Void induced thermal impedance in power semiconductor modules: some transient temperature effects (Conference Record of the 2001 IEEE Industry Applications Conference. 36th IAS Annual Meeting (Cat. No.01CH37248))
- Control system design (at - Automatisierungstechnik)
- Closure on "Theoretical and experimental analyses of photovoltaic systems with voltage and current-based maximum power point tracking"
- A novel modeling method for photovoltaic cells (2004 IEEE 35th Annual Power Electronics Specialists Conference (IEEE Cat. No.04CH37551))
Their papers
- A Lifetime Estimation Technique for Voltage Source Inverters (2013) — 370 citations