Bongtae Han
Electrical and Electronic Engineering · 2004–2015
A researcher in the Science corpus: 2 papers; trusts 1 researcher and is trusted by 1 researcher here, as inferred from the citation graph.
Subfields
- Electrical and Electronic Engineering — 12 citations into it
Whom Bongtae Han trusts overall
Their strongest outbound trust, strongest first, inferred from their citations.
Who trusts Bongtae Han overall
Papers from Bongtae Han's perspective
Ordered by how strongly the researchers Bongtae Han trusts endorse each paper. Same corpus, a different order for every researcher.
- Selected failure mechanisms of modern power modules (Microelectronics and reliability)
- Fundamentals of Power Semiconductor Devices
- Prognostics and health management of electronics (IEEE transactions on components and packaging technologies)
- A Lifetime Estimation Technique for Voltage Source Inverters (IEEE transactions on power electronics)
- A Literature Review of IGBT Fault Diagnostic and Protection Methods for Power Inverters (Annual Meeting of the IEEE Industry Applications Society)
- Reliability of power cycling for IGBT power semiconductor modules (Conference Record of the 2001 IEEE Industry Applications Conference. 36th IAS Annual Meeting (Cat. No.01CH37248))
- Monitoring Solder Fatigue in a Power Module Using Case-Above-Ambient Temperature Rise (IEEE transactions on industry applications)
- Exploration of Power Device Reliability Using Compact Device Models and Fast Electrothermal Simulation (IEEE transactions on industry applications)
- Void induced thermal impedance in power semiconductor modules: some transient temperature effects (Conference Record of the 2001 IEEE Industry Applications Conference. 36th IAS Annual Meeting (Cat. No.01CH37248))
- Performance of diagnosis methods for IGBT open circuit faults in voltage source active rectifiers (2004 IEEE 35th Annual Power Electronics Specialists Conference (IEEE Cat. No.04CH37551))