A Lifetime Estimation Technique for Voltage Source Inverters

By Hui Huang, P. Mawby. IEEE transactions on power electronics, 2013

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In Situ Diagnostics and Prognostics of Solder Fatigue in IGBT Modules for Electric Vehicle Drives (2015, methodology): “of a device need to be determined experimentally which introduces errors from device inhomogeneity, filtering, and curve fitting [36].”
Artificial Intelligence Aided Automated Design for Reliability of Power Electronic Systems (2019, methodology): “Final step is to associate every cycle with its cumulative damage (e.g., using [8] or other device LC data from the relevant manufacturer), and calculate the overall LC over a period of time using the Miner’s rule [9].”
Remaining Useful Lifetime Estimation for Thermally Stressed Power MOSFETs Based on on-State Resistance Variation (2016, background): “The elevated junction temperatures accelerate the aging mechanisms, particularly the gate-oxide degradation, due to the increased amount of trapped charges.”
Physics-of-Failure, Condition Monitoring, and Prognostics of Insulated Gate Bipolar Transistor Modules: A Review (2015, methodology): “The use of lookup tables or linear equations could reduce computational costs significantly [84], [86].”
Junction Temperature Control for More Reliable Power Electronics (2018, background): “This forms a positive feedback loop, which accelerates the aging process [10].”