A. Huang

IEEE Electron Device Letters · 2004

A researcher in the Science corpus: 1 paper; trusts 1 researcher and is trusted by 11 researchers here, as inferred from the citation graph.

Whom A. Huang trusts overall

Their strongest outbound trust, strongest first, inferred from their citations.

  1. Jerry L. Hudgins

Who trusts A. Huang overall

  1. Alex Q. Huang
  2. Hitoshi Umezawa
  3. Srabanti Chowdhury
  4. Kevin G. Crawford
  5. S. Shikata
  6. Isha Maini

Papers from A. Huang's perspective

Ordered by how strongly the researchers A. Huang trusts endorse each paper. Same corpus, a different order for every researcher.

  1. An assessment of wide bandgap semiconductors for power devices
  2. I and i
  3. A thermal model for insulated gate bipolar transistor module (IEEE transactions on power electronics)
  4. Two-step parameter extraction procedure with formal optimization for physics-based circuit simulator IGBT and p-i-n diode models (IEEE transactions on power electronics)
  5. Predicting solder joint reliability for thermal, power, and bend cycle within 25% accuracy (2001 Proceedings. 51st Electronic Components and Technology Conference (Cat. No.01CH37220))
  6. High breakdown voltage AlGaN-GaN HEMTs achieved by multiple field plates (IEEE Electron Device Letters)
  7. Influence of barrier thickness on the high-power performance of AlGaN/GaN HEMTs (IEEE Electron Device Letters)
  8. High breakdown GaN HEMT with overlapping gate structure (IEEE Electron Device Letters)
  9. Electrical breakdown in atmospheric air between closely spaced (0.2 /spl mu/m-40 /spl mu/m) electrical contacts (Proceedings of the Forth-Seventh IEEE Holm Conference on Electrical Contacts (IEEE Cat. No.01CH37192))

Their papers