J. Benedetto

IEEE Transactions on Nuclear Science · 2003–2007

A researcher in the Science corpus: 2 papers; trusts 0 researchers and is trusted by 1 researcher here, as inferred from the citation graph.

Who trusts J. Benedetto overall

1. D. Fleetwood

Papers from J. Benedetto's perspective

Ordered by how strongly the researchers J. Benedetto trusts endorse each paper. Same corpus, a different order for every researcher.

1. Basic mechanisms and modeling of single-event upset in digital microelectronics
2. Statistical Analysis of the Charge Collected in SOI and Bulk Devices Under Heavy lon and Proton Irradiation—Implications for Digital SETs (IEEE Transactions on Nuclear Science)
3. On the go with SONOS
4. RHBD techniques for mitigating effects of single-event hits using guard-gates (IEEE Transactions on Nuclear Science)
5. Digital Single Event Transient Trends With Technology Node Scaling (IEEE Transactions on Nuclear Science)
6. Gate length scaling and threshold voltage control of double-gate MOSFETs (International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No.00CH37138))
7. WIT3: Web Inventory of Transcribed and Translated Talks
8. Learning Phrase Representations using RNN Encoder–Decoder for Statistical Machine Translation
9. Minimum Error Rate Training in Statistical Machine Translation
10. A Recursive Recurrent Neural Network for Statistical Machine Translation

Their papers

• Characterization of Digital Single Event Transient Pulse-Widths in 130-nm and 90-nm CMOS Technologies (2007) — 184 citations
• Radiation effects and hardening of MOS technology: devices and circuits (2003) — 318 citations