Radiation effects and hardening of MOS technology: devices and circuits

By H. Hughes, J. Benedetto. 2003

318 citations recorded by the source corpus.

Subfields: Electrical and Electronic Engineering

View Paper: https://www.semanticscholar.org/paper/34d99e0f801229a1fa1c4dd628f4dbc1e151b4bc

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In Electrical and Electronic Engineering

1. D. Fleetwood

Citations in the corpus

• Evolution of Total Ionizing Dose Effects in MOS Devices With Moore’s Law Scaling (2018, background): “Finally, power MOS devices [19], [87], [93], [94], flash and some other types of nonvolatile memory technologies [95]–[99], and other devices incorporating relatively Fig.”